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Mots clés
Adsorption
Nuclear reaction analysis
Transparent conductive oxide TCO
Zinc oxide
Evaluation
Nickel
3C-SiC
HfO2
AC susceptibility
ALD
7550Pp
Auger electron spectroscopy AES
2H
15N
Interface defects
RBS
Nanostructures
18O resonance
Ageing
Ion beam analysis
Oxidation
Nitridation
13C
Raman spectroscopy
Oxygen deficiency
27Ald p&α
XPS
Periodic multilayer
Capillary condensation
Silica
Topological insulators
Diffusion
Ion implantation
Al2O3
X-ray diffraction
Pb centers
Gold
Epitaxial growth
EPR
Topological defects
6855Jk
8140Ef
27Alda
Magnetic semiconductors
Adsorption Isotherms
Rutherford backscattering spectrometry RBS
27Aldp
Magnetic anisotropy
Stable isotopic tracing
18O
GaMnAs
7550Ee
Acoustic
Aluminum
Thin film
PIXE
17O
Charge exchange
Isotopic Tracing
Magnetization curves
Silicon Carbide
Multilayer
Ferromagnetic resonance
SiC
Kossel diffraction
17Op
Photoluminescence
Epitaxy
NRP
Atomic Layer Deposition ALD
Nanoparticles
XRD
Acoustic propreties of solid
Thin films
Defects
17Opp
7630Lh
Sputtering
Indium oxide
Low energy electron diffraction LEED
Annealing
Hysteresis
Pulsed laser deposition
Energy loss
Growth
NRA
Passivation
Measurement
Silicon
Alloys
ADSORPTION DESORPTION HYSTERESIS
Channeling
AFM
Aluminium
Gallium oxide
Adsorbed layers
Metal-insulator transition
Silicon carbide
Density functional theory
Nuclear resonance profiling NRP