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Article Dans Une Revue Thin Solid Films Année : 2017

Thickness-dependent thermal properties of amorphous insulating thin films measured by photoreflectance microscopy

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hal-01915677 , version 1 (07-11-2018)

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Abeer Al Motar, Gilles Tessier, Riina Ritasalo, Mikko Matvejeff, Jonhy Stormonth-Darling, et al.. Thickness-dependent thermal properties of amorphous insulating thin films measured by photoreflectance microscopy. Thin Solid Films, 2017, 642, pp.157 - 162. ⟨10.1016/j.tsf.2017.09.037⟩. ⟨hal-01915677⟩
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