A Review of Research on the Effect of Aging on the EMC of Integrated Circuits - Université Toulouse 3 Accéder directement au contenu
Communication Dans Un Congrès Année : 2016

A Review of Research on the Effect of Aging on the EMC of Integrated Circuits

Sonia Ben Dhia
Alexandre Boyer

Résumé

Electromagnetic compatibility (EMC) is an essential requirement to electronic systems in which integrated circuits have a major influence. Intrinsic degradation mechanisms, which produces anticipated wear-out in deep submicron components threat not only the reliability of circuits, but also EMC performances. The need to predict and ensure long-term EMC has become a key challenge. This paper aims at presenting the last results on the long-term EMC topic. The paper clarifies the effect of device degradation mechanisms on EMC level drifts during lifetime and presents some attempts to predict these evolutions.

Domaines

Electronique
Fichier principal
Vignette du fichier
PID4124931.pdf (368.13 Ko) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-01403874 , version 1 (28-11-2016)

Identifiants

Citer

Sonia Ben Dhia, Alexandre Boyer. A Review of Research on the Effect of Aging on the EMC of Integrated Circuits. 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC 2016), May 2016, Shenzhen, China. ⟨10.1109/APEMC.2016.7522971⟩. ⟨hal-01403874⟩
100 Consultations
212 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More