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Journal Articles Solid-State Electronics Year : 2020

Improved physics-based analysis to discriminate the flicker noise origin at very low temperature and drain voltage polarization

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hal-02475438 , version 1 (22-08-2022)

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Attribution - NonCommercial

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B Cretu, D. Boudier, E. Simoen, A. Veloso, N. Collaert, et al.. Improved physics-based analysis to discriminate the flicker noise origin at very low temperature and drain voltage polarization. Solid-State Electronics, 2020, pp.107771. ⟨10.1016/j.sse.2020.107771⟩. ⟨hal-02475438⟩
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