Ellipsometry and reflectivity at the Brewster angle : tools to study the bending elasticity and phase transitions in monolayers at liquid interfaces - Université Paris Cité Access content directly
Journal Articles Thin Solid Films Year : 1993

Ellipsometry and reflectivity at the Brewster angle : tools to study the bending elasticity and phase transitions in monolayers at liquid interfaces

Abstract

In recent years, two non-perturbative techniques derived from ellipsometry and reflectivity at the Brewster angle have been developed to study monolayers at liquid interfaces. The first is an ellipsometric method to measure the bending elastic modulus of monolayers at the oil-water interfaces. The second is microscopy at the Brewster angle.

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hal-03876158 , version 1 (28-11-2022)

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Sylvie Hénon, Jacques Meunier. Ellipsometry and reflectivity at the Brewster angle : tools to study the bending elasticity and phase transitions in monolayers at liquid interfaces. Thin Solid Films, 1993, 234 (1-2), pp.471-474. ⟨10.1016/0040-6090(93)90310-L⟩. ⟨hal-03876158⟩
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